White Paper: Test & Measurement
EMI Debugging at Board Level
EMI radiation and crosstalk caused by poor shielding can lead to signal quality and performance degradation in electronic RF devices. To minimize the overall EMI of electronic devices, local radiation sources on the integrated boards and modules must be well known. RF designers perform near-field measurements at the module level to determine whether electromagnetic disturbance complies with the applicable EMC standard to be able to take corrective actions at an early stage.
This application note describes how the R&S®Spectrum Rider FPH handheld spectrum analyzer, in combination with the R&S®HZ-15 near-field probes, offers a cost-efficient and user-friendly solution for quickly locating and analyzing EMI problems on boards and modules during design. The analyzer’s high sensitivity (DANL of typ. < –163 dBm up to 3 GHz) makes it possible to measure even very small emissions.
Adding the R&S®HZ-16 preamplifier between the near-field probe and the spectrum analyzer increases sensitivity, making it possible to measure even very weak high-frequency fields up to 3 GHz.
The R&S®Spectrum Rider trace math function, in combination with the near-field probes, is ideal for preliminary investigation of a DUT’s EMI performance right on the developer’s bench. As the lab is inevitably a noisy and constantly changing electrical environment, a shielded chamber is required to accurately and repeatably determine the EMI performance of a device.
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