JTAG Technologies (Eindhoven, Netherlands) has announced a new support package for board-level and system designers looking to implement a convenient BIT (Built-In Test) access for boundary-scan testing and onboard device (re)programming.

For the first time since the introduction of the IEEE Std. 1149.1 in 1990, existing USB to JTAG resources, which design engineers frequently include on their boards, can be linked to high-level boundary-scan test software. In conjunction with FTDI Ltd, JTAG Technologies is pleased to offer a support option for the popular FTDI 2232D and the new FT2232H/4232H (Hi-speed USB 2.0) devices that allow direct connection from PC to target (UUT) via a standard USB cable.

Anticipated users of this support option will include field repair technicians, who will be able to reduce their tool inventory, and design engineers looking to exercise JTAG circuitry during the hardware debug phase. The device support extends from the JTAG ProVision application development software through to its run-time, production solutions — as well as the free ‘BUZZ’ and low-cost ‘CLIP’ and ‘SCRIPT’ JTAG Live modules, which can be downloaded from www.jtaglive.com.

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Embedded Technology Magazine

This article first appeared in the June, 2011 issue of Embedded Technology Magazine.

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